发明授权
- 专利标题: Multi-layered conductive metal oxide structures and methods for facilitating enhanced performance characteristics of two-terminal memory cells
- 专利标题(中): 多层导电金属氧化物结构和促进两端存储单元性能特性的方法
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申请号: US14453982申请日: 2014-08-07
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公开(公告)号: US09484533B2公开(公告)日: 2016-11-01
- 发明人: Jian Wu , Rene Meyer
- 申请人: Unity Semiconductor Corporation
- 申请人地址: US CA Sunnyvale
- 专利权人: UNITY SEMICONDUCTOR CORPORATION
- 当前专利权人: UNITY SEMICONDUCTOR CORPORATION
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Lowenstein Sandler LLP
- 主分类号: H01L45/00
- IPC分类号: H01L45/00 ; H01L27/24
摘要:
A memory cell including a two-terminal re-writeable non-volatile memory element having at least two layers of conductive metal oxide (CMO), which, in turn, can include a first layer of CMO including mobile oxygen ions, and a second layer of CMO formed in contact with the first layer of CMO to cooperate with the first layer of CMO to form an ion obstruction barrier. The ion obstruction barrier is configured to inhibit transport or diffusion of a subset of mobile ion to enhance, among other things, memory effects and cycling endurance of memory cells. At least one layer of an insulating metal oxide that is an electrolyte to the mobile oxygen ions and configured as a tunnel barrier is formed in contact with the second layer of CMO.
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