Invention Grant
- Patent Title: Method and system for computer assisted hot-tracing mechanism
- Patent Title (中): 计算机辅助热追踪机制的方法与系统
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Application No.: US14168375Application Date: 2014-01-30
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Publication No.: US09489286B2Publication Date: 2016-11-08
- Inventor: Nipun Arora , Hui Zhang , Junghwan Rhee , Guofei Jiang , Kenji Yoshihira
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: JP
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP
- Agent Joseph Kolodka
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36

Abstract:
This invention provides a new mechanism for “Hot-Tracing” using a novel placeholder mechanism and binary rewriting techniques, which leverages existing compiler flags in order to enable light-weight and highly flexible dynamic instrumentation. Broadly, I-Probe can be divided in 2 distinct workflows—1. Pre-processing (ColdPatch), and 2. Hot Tracing. The first phase is a pre-processing mechanism to prepare the binary for phase 2. The second phase is the actual hot-tracing mechanism, which allows users to dynamically instrument functions (more specifically symbols) of their choice.
Public/Granted literature
- US20140229921A1 Method and System for Computer Assisted Hot-Tracing Mechanism Public/Granted day:2014-08-14
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