Invention Grant
US09492133B2 Apparatus and method for acquiring optimal multi-energy X-ray image
有权
用于获取最佳多能X射线图像的装置和方法
- Patent Title: Apparatus and method for acquiring optimal multi-energy X-ray image
- Patent Title (中): 用于获取最佳多能X射线图像的装置和方法
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Application No.: US13845742Application Date: 2013-03-18
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Publication No.: US09492133B2Publication Date: 2016-11-15
- Inventor: Dong Goo Kang , Sung Hoon Kang , Sung Su Kim , Young Hun Sung , Hyun Hwa Oh , Seok Min Han
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2012-0118755 20121025
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/04

Abstract:
An apparatus and method for acquiring an optimal MEX image may include an X-ray source to generate an X-ray and to irradiate the X-ray, an energy identification detector to acquire a MEX image that is generated when the irradiated X-ray penetrates an object, and an optimal MEX processor to generate an optimal MEX parameter based on a characteristic of the object and to control at least one of the X-ray source and the energy identification detector based on the generated optimal MEX parameter.
Public/Granted literature
- US20140119506A1 APPARATUS AND METHOD FOR ACQUIRING OPTIMAL MULTI-ENERGY X-RAY IMAGE Public/Granted day:2014-05-01
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