发明授权
- 专利标题： Electromagnetic interference measuring device and electromagnetic interference measuring method
- 专利标题（中）： 电磁干扰测量装置及电磁干扰测量方法
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申请号： US14027573申请日： 2013-09-16
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公开(公告)号： US09494633B2公开(公告)日： 2016-11-15
- 发明人: Soon Il Yeo
- 申请人： Electronics and Telecommunications Research Institute
- 申请人地址： KR Daejeon
- 专利权人： ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 当前专利权人： ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- 当前专利权人地址： KR Daejeon
- 代理机构： Rabin & Berdo, P.C.
- 优先权： KR10-2012-0146840 20121214
- 主分类号： G01R27/28
- IPC分类号： G01R27/28 ; G01R31/00 ; G01R29/08
摘要：
Provided is an electromagnetic interference (EMI) measuring device. The EMI measuring device according to the present invention includes an electromagnetic wave eliminating unit eliminating remaining electromagnetic waves from a DUT in response to an eliminating control signal of the control unit. The control unit may calculate EMI of the DUT on the basis of a measured result measured before the elimination of remaining electromagnetic waves. The EMI measuring device according to the present invention may compensate for an error due to remaining electromagnetic waves and measure EMI at high accuracy.
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