Invention Grant
US09501959B2 Mother substrate with switch disconnecting test part, array test method thereof and display substrate
有权
母基片,带开关断开试验件,其阵列试验方法及显示基板
- Patent Title: Mother substrate with switch disconnecting test part, array test method thereof and display substrate
- Patent Title (中): 母基片,带开关断开试验件,其阵列试验方法及显示基板
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Application No.: US14320797Application Date: 2014-07-01
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Publication No.: US09501959B2Publication Date: 2016-11-22
- Inventor: Ji-Sun Kim , Chong-Chul Chai , Yeong-Keun Kwon
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin, Gyeonggi-Do
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin, Gyeonggi-Do
- Agency: Lee & Morse P.C.
- Priority: KR10-2013-0113855 20130925
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G09G3/36

Abstract:
A mother substrate includes a display substrate cell defined by a scribe line, the display substrate cell including a plurality of gate lines, a gate circuit part driving the gate lines, and a gate pad part connected to the gate circuit part, a gate test pad part in a peripheral area surrounding the display substrate cell, the gate test pad part being configured to receive a gate test signal, a gate test line part connecting the gate test pad part and the gate pad part, and a switching part connected to the gate test line part and configured to control turning on and turning off of the gate test line part.
Public/Granted literature
- US20150084666A1 MOTHER SUBSTRATE, ARRAY TEST METHOD THEREOF AND DISPLAY SUBSTRATE Public/Granted day:2015-03-26
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