Invention Grant
US09501959B2 Mother substrate with switch disconnecting test part, array test method thereof and display substrate 有权
母基片,带开关断开试验件,其阵列试验方法及显示基板

Mother substrate with switch disconnecting test part, array test method thereof and display substrate
Abstract:
A mother substrate includes a display substrate cell defined by a scribe line, the display substrate cell including a plurality of gate lines, a gate circuit part driving the gate lines, and a gate pad part connected to the gate circuit part, a gate test pad part in a peripheral area surrounding the display substrate cell, the gate test pad part being configured to receive a gate test signal, a gate test line part connecting the gate test pad part and the gate pad part, and a switching part connected to the gate test line part and configured to control turning on and turning off of the gate test line part.
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