Invention Grant
- Patent Title: Metal thin film resistor and process
- Patent Title (中): 金属薄膜电阻和工艺
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Application No.: US14548812Application Date: 2014-11-20
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Publication No.: US09502284B2Publication Date: 2016-11-22
- Inventor: Abbas Ali , Eric Beach
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Gregory J. Albin; Frank D. Cimino
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/522 ; H01L23/528 ; H01L49/02 ; H01L23/532

Abstract:
An integrated circuit with a metal thin film resistor with an overlying etch stop layer. A process for forming a metal thin film resistor in an integrated circuit with the addition of one lithography step.
Public/Granted literature
- US20150187632A1 METAL THIN FILM RESISTOR AND PROCESS Public/Granted day:2015-07-02
Information query
IPC分类: