Invention Grant
- Patent Title: Onboard measuring system for miter saws
- Patent Title (中): 板锯测量系统
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Application No.: US14543501Application Date: 2014-11-17
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Publication No.: US09505071B2Publication Date: 2016-11-29
- Inventor: Colin Knight , Iqbal Singh , Eugene Kulig
- Applicant: Sears Brands, L.L.C.
- Applicant Address: US IL Hoffman Estates
- Assignee: Sears Brands, L.L.C.
- Current Assignee: Sears Brands, L.L.C.
- Current Assignee Address: US IL Hoffman Estates
- Agency: McAndrews, Held & Malloy, Ltd.
- Main IPC: B23Q17/22
- IPC: B23Q17/22 ; B23D59/00 ; B27B27/02 ; G01B3/10 ; B23Q17/20

Abstract:
Apparatuses and methods based thereon are provided for onboard measurements in miter saws. A measurement device may be attached to or incorporated into a miter saw, where the measurement device being configured to provide onboard measurement when cuts are made using the miter saw. The measurement device may comprise a tape based measurement device. The measurement device may be portable to enable detaching it from the miter saw when on-location measurements are made, and attaching it to the miter saw when cut measurements are provided. The measurement device may comprise an output component (e.g., digital display) for outputting measurement readings and/or information associated with cut measurements. The measurement device (and/or the miter saw itself) may be configured for communicating signals wirelessly in accordance with one or more wireless technologies, such as to enable receiving measurements made remotely.
Public/Granted literature
- US20160136742A1 ONBOARD MEASURING SYSTEM FOR MITER SAWS Public/Granted day:2016-05-19
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