Invention Grant
US09507941B2 Method of verifying integrity of electronic device, storage medium, and electronic device
有权
验证电子设备，存储介质和电子设备的完整性的方法
- Patent Title: Method of verifying integrity of electronic device, storage medium, and electronic device
- Patent Title (中): 验证电子设备，存储介质和电子设备的完整性的方法
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Application No.: US14536940Application Date: 2014-11-10
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Publication No.: US09507941B2Publication Date: 2016-11-29
- Inventor: Peng Ning , Moo-Young Kim , Min-Jung Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Cha & Reiter, LLC
- Priority: KR10-2013-0143323 20131122
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F21/57
Abstract:
Disclosed herein are techniques for verifying the integrity of an electronic device. A normal world virtual processor and a secure world virtual processor are instantiated. An integrity verification agent is executed by the secure world virtual processor. A kernel operation attempted by the normal world virtual processor is intercepted by the secure world virtual processor.
Public/Granted literature
- US20150150127A1 METHOD OF VERIFYING INTEGRITY OF ELECTRONIC DEVICE, STORAGE MEDIUM, AND ELECTRONIC DEVICE Public/Granted day:2015-05-28
Information query
