发明授权
- 专利标题: Apparatus for reducing the effect of contamination on a rapid thermal process
- 专利标题(中): 用于减少污染对快速热过程的影响的装置
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申请号: US14550781申请日: 2014-11-21
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公开(公告)号: US09514969B2公开(公告)日: 2016-12-06
- 发明人: Aaron Miller , Mehran Behdjat , Norman L. Tam , Michael Liu
- 申请人: Applied Materials, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson & Sheridan, LLP
- 主分类号: H01L21/67
- IPC分类号: H01L21/67 ; H01L21/66 ; H01L21/324 ; H01L21/687
摘要:
Embodiments of the present disclosure provide a cover assembly that includes a cover disposed between a device side surface of a substrate and a reflector plate, which are disposed within a thermal processing chamber. The presence of the cover between the device side surface of a substrate and a reflector plate has many advantages over conventional thermal processing chamber designs, which include an improved temperature uniformity during processing, a reduced chamber down time and an improved cost-of-ownership of the processes performed in the thermal processing chamber. In some configurations, the cover includes two or more ports that are formed therein and are positioned to deliver a gas, from a space formed between the reflector plate and the cover, to desired regions of the substrate during processing to reduce the temperature variation across the substrate.
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