发明授权
- 专利标题： Fluoroscopic image density correction method, non-destructive inspection method, and image processing device
- 专利标题（中）： 透视图像浓度校正方法，无损检测方法和图像处理装置
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申请号： US14705939申请日： 2015-05-06
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公开(公告)号： US09524546B2公开(公告)日： 2016-12-20
- 发明人: Makiko Nagashima , Yasunori Narukawa
- 申请人： FUJIFILM Corporation
- 申请人地址： JP Tokyo
- 专利权人： FUJIFILM Corporation
- 当前专利权人： FUJIFILM Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Jianq Chyun IP Office
- 优先权： JP2012-255455 20121121
- 主分类号： G06T7/00
- IPC分类号： G06T7/00 ; G01B15/02 ; G01N23/04 ; G01N21/954
摘要：
A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image are corrected.
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