Invention Grant
- Patent Title: Test and measurement instrument and method of switching waveform display styles
- Patent Title (中): 测试和测量仪器以及开关波形显示方式
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Application No.: US14178684Application Date: 2014-02-12
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Publication No.: US09529017B2Publication Date: 2016-12-27
- Inventor: Gregory A. Martin , David D. Farrell , Evan A. Dickinson
- Applicant: TEKTRONIX, INC.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agent Michael A. Nelson; Marger Johnson
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G01R13/02 ; G09G5/02

Abstract:
A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.
Public/Granted literature
- US20140160144A1 TEST AND MEASUREMENT INSTRUMENT AND METHOD OF SWITCHING WAVEFORM DISPLAY STYLES Public/Granted day:2014-06-12
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