发明授权
US09536298B2 Electronic device and method for detecting surface flaw of object
有权
用于检测物体表面缺陷的电子装置和方法
- 专利标题: Electronic device and method for detecting surface flaw of object
- 专利标题(中): 用于检测物体表面缺陷的电子装置和方法
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申请号: US14334907申请日: 2014-07-18
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公开(公告)号: US09536298B2公开(公告)日: 2017-01-03
- 发明人: Hou-Hsien Lee , Chang-Jung Lee , Chih-Ping Lo
- 申请人: Shenzhen Airdrawing Technology Service CO., LTD.
- 申请人地址: CN Shenzhen
- 专利权人: Shenzhen Airdrawing Technology Service Co., Ltd
- 当前专利权人: Shenzhen Airdrawing Technology Service Co., Ltd
- 当前专利权人地址: CN Shenzhen
- 代理商 Zhigang Ma
- 优先权: TW102125840A 20130719
- 主分类号: H04N7/18
- IPC分类号: H04N7/18 ; G06T7/00
摘要:
Method for detecting a surface flaw of an object using an electronic device includes requesting a detection device to control a camera unit to capture a current image of a test object placed on the detection device. The current image includes a sidewall image and a reflected image. The method obtains the current image, and detects whether the sidewall image has a surface flaw. When the sidewall image has a surface flaw, a rotation angle of the test object is determined based on the reflected image. The method obtains a standard sidewall image of a standard object stored in a storage device of the electronic device, based on the rotation angle, compares the sidewall image with the standard sidewall image, and determines and displays a position of the surface flaw on a sidewall of the test object based on the comparison.
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