Invention Grant
- Patent Title: System for producing a system clock and temperature gradient detection system
- Patent Title (中): 系统时钟和温度梯度检测系统
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Application No.: US14416467Application Date: 2013-08-19
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Publication No.: US09537446B2Publication Date: 2017-01-03
- Inventor: Eric Van Den Berg , Bart Pauwels
- Applicant: ALCATEL LUCENT
- Applicant Address: FR Boulogne-Billancourt
- Assignee: Alcatel Lucent
- Current Assignee: Alcatel Lucent
- Current Assignee Address: FR Boulogne-Billancourt
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: EP12306012 20120821
- International Application: PCT/EP2013/067212 WO 20130819
- International Announcement: WO2014/029718 WO 20140227
- Main IPC: H03L7/06
- IPC: H03L7/06 ; H03B5/04 ; H03L1/02 ; G01K7/00 ; H03B5/30 ; H03L7/099

Abstract:
System for producing a system clock signal comprising a local oscillator configured to generate a first clock signal; a temperature detector configured to detect a temperature change above a critical value in an area including the local oscillator; an obtaining module configured to obtain a second clock signal; a clock generator configured to generate the system clock signal in a first manner, using the first clock signal, in a normal mode when the temperature detector does not detect a temperature change above the critical value, and in a second manner different from the first manner, using the second clock signal, in a reverse hold-over mode when the temperature detector has detected a temperature change above the critical value.
Public/Granted literature
- US20150180409A1 SYSTEM FOR PRODUCING A SYSTEM CLOCK AND TEMPERATURE GRADIENT DETECTION SYSTEM Public/Granted day:2015-06-25
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