Invention Grant
- Patent Title: Package inspection system
- Patent Title (中): 包装检验系统
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Application No.: US14680460Application Date: 2015-04-07
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Publication No.: US09541499B2Publication Date: 2017-01-10
- Inventor: Noriaki Ikeda
- Applicant: System Square Inc.
- Applicant Address: JP Nagaoka-Shi
- Assignee: SYSTEM SQUARE INC.
- Current Assignee: SYSTEM SQUARE INC.
- Current Assignee Address: JP Nagaoka-Shi
- Agency: Brinks Gilson & Lione
- Priority: JP2012-229565 20121017
- Main IPC: G01N21/3581
- IPC: G01N21/3581 ; G01N21/90 ; G01N23/10 ; G01N21/84 ; G01V5/00 ; H04N5/32 ; H04N5/33 ; B65B57/10 ; G01N33/02

Abstract:
A package inspection system includes a conveyor mechanism 6, an X-ray generator 10 applying X rays to a package W1 conveyed by the conveyor mechanism 6, an X-ray sensor 13, and an optical sensor 15. First image data showing the outline of the content of the package W1 are generated based on detection output from the X-ray sensor 13. Second image data showing the outline of the wrapping of the package W1 are generated based on detection output from an optical sensor 15. The relative position of the wrapping and the content is determined based on the first and second image data, so that failures, e.g., the content caught in a seal of the wrapping can be detected accurately. The package inspection system can accurately determine a position of a wrapping and the content of a package even if a package has a light non-transmissive wrapping.
Public/Granted literature
- US20150241341A1 PACKAGE INSPECTION SYSTEM Public/Granted day:2015-08-27
Information query
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