发明授权
- 专利标题: Overlapping trace norms for multi-view learning
- 专利标题(中): 用于多视图学习的重叠跟踪规范
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申请号: US14339994申请日: 2014-07-24
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公开(公告)号: US09542654B2公开(公告)日: 2017-01-10
- 发明人: Guillaume Bouchard , Cedric Philippe Charles Jean Ghislain Archambeau , Behrouz Behmardi
- 申请人: Xerox Corporation
- 申请人地址: US CT Norwalk
- 专利权人: XEROX CORPORATION
- 当前专利权人: XEROX CORPORATION
- 当前专利权人地址: US CT Norwalk
- 代理机构: Fay Sharpe LLP
- 主分类号: G06N99/00
- IPC分类号: G06N99/00 ; G06F17/30
摘要:
In multi-view learning, optimized prediction matrices are determined for V≧2 views of n objects, and a prediction of a view of an object is generated based on the optimized prediction matrix for that view. An objective is optimized, wherein is a set of parameters including at least the V prediction matrices and a concatenated matrix comprising a concatenation of the prediction matrices, and comprises a sum including at least a loss function for each view, a trace norm of the prediction matrix for each view, and a trace norm of the concatenated matrix. may further include a sparse matrix for each view, with further including an element-wise norm of the sparse matrix for each view. may further include regularization parameters scaling the trace norms of the prediction matrices and the trace norm of the concatenated matrix.
公开/授权文献
- US20160026925A1 OVERLAPPING TRACE NORMS FOR MULTI-VIEW LEARNING 公开/授权日:2016-01-28
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