发明授权
- 专利标题: Integrated circuit with power network aware metal fill
- 专利标题(中): 集成电路与电力网络识别金属填充
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申请号: US14860726申请日: 2015-09-22
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公开(公告)号: US09552453B1公开(公告)日: 2017-01-24
- 发明人: Rishabh Agarwal , Sumit Kumar Jha
- 申请人: FREESCALE SEMICONDUCTOR, INC.
- 申请人地址: US TX Austin
- 专利权人: FREESCALE SEMICONDUCTOR, INC.
- 当前专利权人: FREESCALE SEMICONDUCTOR, INC.
- 当前专利权人地址: US TX Austin
- 代理商 Charles E. Bergere
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
In the physical design of an integrated circuit, comparing metal fill locations with an average least resistance path (LRP) for a cell and then filling the location with either power or ground tiles based on the comparison. For each metal layer, all of the metal fill locations are determined and nearby metal fills, i.e., those within a predetermined radius of a located metal fill are connected. A Design Rule Check (DRC) is performed to ensure that connected metal fills meet design specifications, for example, that connected metal fills are not too close to a signal line. The metal fill method improves the power integrity of the design.
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