发明授权
- 专利标题: Magnetic tunnel junctions
- 专利标题(中): 磁隧道结
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申请号: US15000620申请日: 2016-01-19
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公开(公告)号: US09553259B2公开(公告)日: 2017-01-24
- 发明人: Manzar Siddik
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Wells St. John, P.C.
- 主分类号: G11B5/127
- IPC分类号: G11B5/127 ; H01L43/10 ; H01L43/02 ; H01L43/08
摘要:
A magnetic tunnel junction comprises a conductive first magnetic electrode comprising magnetic recording material. A conductive second magnetic electrode is spaced from the first electrode and comprises magnetic reference material. A non-magnetic tunnel insulator material is between the first and second electrodes. The magnetic recording material of the first electrode comprises a first crystalline magnetic region, in one embodiment comprising Co and Fe. In one embodiment, the first electrode comprises a second amorphous region comprising amorphous XN, where X is one or more of W, Mo, Cr, V, Nb, Ta, Al, and Ti. In one embodiment, the first electrode comprises a second region comprising Co, Fe, and N.
公开/授权文献
- US20160329489A1 Magnetic Tunnel Junctions 公开/授权日:2016-11-10
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