Invention Grant
- Patent Title: System and method for calibration of an optical module
- Patent Title (中): 用于校准光学模块的系统和方法
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Application No.: US14860548Application Date: 2015-09-21
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Publication No.: US09553663B1Publication Date: 2017-01-24
- Inventor: Todd Rope
- Applicant: INPHI CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: INPHI CORPORATION
- Current Assignee: INPHI CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Ogawa P.C.
- Agent Richard T. Ogawa
- Main IPC: H04B10/08
- IPC: H04B10/08 ; H04B10/07

Abstract:
A system and method for calibrating an optical module. The optical module including a microprocessor with non-volatile memory is provided at a calibration station for measuring calibrated value of a device parameter against raw values starting from minimum value in each of multiple zones of a primary parameter with one or more secondary parameters at least being set to a basis calibration point to determine coefficients for generating a N-spline function for the multiple zones and multiple multipliers for each zone corresponding to multiple calibration points. The coefficients and multiple multipliers are stored in the non-volatile memory and reused respectively for calculating a basis calibrated value based on any current raw value of the primary parameter a N-spline function in particular zone and for determining a final multiplier by interpolation of the multiple multipliers associated with the one or more secondary parameters, leading to a calibrated value for any condition.
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