Invention Grant
US09554762B2 Method and apparatus for obtaining x-ray image of region of interest of object
有权
用于获得物体感兴趣区域的X射线图像的方法和装置
- Patent Title: Method and apparatus for obtaining x-ray image of region of interest of object
- Patent Title (中): 用于获得物体感兴趣区域的X射线图像的方法和装置
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Application No.: US14301820Application Date: 2014-06-11
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Publication No.: US09554762B2Publication Date: 2017-01-31
- Inventor: Tae-kyun Kim , Sung-nam Kim , Jae-chool Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0066794 20130611; KR10-2014-0061170 20140521
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/06 ; A61B5/00 ; A61B6/03 ; A61B6/04 ; A61B5/055
Abstract:
A method of obtaining an X-ray image, the method including: obtaining a first image of an object; receiving a determination whether the first image includes an entirety of a region of interest (ROI); and obtaining a second image of the object, the second image including a portion of the ROI which is absent in the first image.
Public/Granted literature
- US20150110245A1 METHOD AND APPARATUS FOR OBTAINING X-RAY IMAGE OF REGION OF INTEREST OF OBJECT Public/Granted day:2015-04-23
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