Invention Grant
- Patent Title: Fixed voltage sensing in a memory device
- Patent Title (中): 存储器件中的固定电压检测
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Application No.: US14451071Application Date: 2014-08-04
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Publication No.: US09558803B2Publication Date: 2017-01-31
- Inventor: Adam D. Johnson
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
Methods for sensing ferroelectric memory devices and apparatuses using the same have been disclosed. One such apparatus includes a ferroelectric memory cell coupled to a data line, a reference capacitance, and a common node coupled between the data line and the reference capacitance. A current mirror circuit is coupled to the data line and the reference capacitance. During a sense operation, the common node is configured to be at a fixed voltage and the current mirror circuit is configured to mirror displacement current from the reference capacitance to the ferroelectric memory cell.
Public/Granted literature
- US20160035406A1 FIXED VOLTAGE SENSING IN A MEMORY DEVICE Public/Granted day:2016-02-04
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