Invention Grant
- Patent Title: Measuring device with calibration
- Patent Title (中): 带校准的测量装置
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Application No.: US14032571Application Date: 2013-09-20
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Publication No.: US09562756B2Publication Date: 2017-02-07
- Inventor: Jörg Seewig
- Applicant: JENOPTIK Industrial Metrology Germany GmbH
- Applicant Address: DE Villingen-Schwenningen
- Assignee: JENOPTIK Industrial Metrology Germany GmbH
- Current Assignee: JENOPTIK Industrial Metrology Germany GmbH
- Current Assignee Address: DE Villingen-Schwenningen
- Agency: Shlesinger, Arkwright & Garvey LLP
- Priority: DE102012018580 20120920
- Main IPC: G01B3/30
- IPC: G01B3/30 ; G01B5/10 ; B24B5/42 ; G01B5/08 ; G01B5/20 ; B24B49/04

Abstract:
A measuring device for in-process measurement of test pieces during a machining operation on a machine tool, in particular a grinding machine, has a base body, and a measuring head movable between a neutral position and a measuring position and which is connected to the base body via a rod assembly which is configured and set up in such a way that the measuring head in the measuring position follows orbital rotations of a test piece about a rotational axis. The measuring head has a measuring sensor which is deflectable along a linear axis for recording measured values during a measuring operation. A control apparatus is provided for controlling the measuring operation. The control apparatus is configured and set up in such a way that the measuring device may be calibrated in a calibration mode.
Public/Granted literature
- US20140083162A1 Measuring Device Public/Granted day:2014-03-27
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