A smart self-repair device includes an ARE array configured to store information on respective bits of a fail address in fuses; a self-repair control block configured to store a row address and a column address corresponding to a fail bit when a fail occurs, analyze a fail mode by comparing the fail address inputted in a test and the stored addresses, and output fail address information and row fuse set information or column fuse set information according to the fail mode; a data control block configured to output repair information to the ARE array according to the fail address information and the row fuse set information or the column fuse set information; and a rupture control block configured to control a rupture operation of the ARE array.