Invention Grant
- Patent Title: Apparatus and method for measuring tactile information
- Patent Title (中): 用于测量触觉信息的装置和方法
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Application No.: US14075426Application Date: 2013-11-08
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Publication No.: US09568379B2Publication Date: 2017-02-14
- Inventor: Soo-Chul Lim , Jong Baeg Kim , Joon Ah Park , Soon Jae Pyo , Min Ook Kim , Jae Ik Lee , Tae Young Chung
- Applicant: SAMSUNG ELECTRONICS CO., LTD. , INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Applicant Address: KR Suwon-si KR Seoul
- Assignee: Samsung Electronics Co., Ltd.,Industry-Academic Cooperation Foundation, Yonsei University
- Current Assignee: Samsung Electronics Co., Ltd.,Industry-Academic Cooperation Foundation, Yonsei University
- Current Assignee Address: KR Suwon-si KR Seoul
- Agency: NSIP Law
- Priority: KR10-2013-0028396 20130318
- Main IPC: G01L5/10
- IPC: G01L5/10 ; G01L1/14 ; G01L1/20 ; G01L5/16

Abstract:
An apparatus and method for measuring a tactile information, using a material having variable pressure dependent properties is disclosed. The apparatus for measuring the tactile information may include a plurality of pressure measurement units to measure a magnitude of an external pressure using a material having variable properties, and a tactile information measurement unit to measure a three-dimensional (3D) tactile information based on the external pressure using a location of the plurality of pressure measurement units and a pressure measured by the plurality of pressure measurement units.
Public/Granted literature
- US20140260675A1 APPARATUS AND METHOD FOR MEASURING TACTILE INFORMATION Public/Granted day:2014-09-18
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