Invention Grant
- Patent Title: Automated focusing, cleaning, and multiple location sampling spectrometer system
- Patent Title (中): 自动对焦,清洗和多位置采样光谱仪系统
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Application No.: US14983933Application Date: 2015-12-30
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Publication No.: US09568430B2Publication Date: 2017-02-14
- Inventor: David Day
- Applicant: SciAps, Inc.
- Applicant Address: US MA Woburn
- Assignee: SciAps, Inc.
- Current Assignee: SciAps, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Iandiorio Teska & Coleman, LLP
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01N21/71 ; G01J3/28 ; G01J3/443 ; G01N21/65

Abstract:
An analysis system includes a moveable focusing lens, a laser (typically an eye safe laser) having an output directed at the focusing lens, and a spectrometer outputting intensity data from a sample. A controller system is responsive to the spectrometer and is configured to energize the laser, process the output of the spectrometer, and adjust the position of the focusing lens relative to the sample until the spectrometer output indicates a maximum or near maximum intensity resulting from a laser output focused to a spot on the sample.
Public/Granted literature
- US20160139053A1 AUTOMATED FOCUSING, CLEANING, AND MULTIPLE LOCATION SAMPLING SPECTROMETER SYSTEM Public/Granted day:2016-05-19
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