Invention Grant
- Patent Title: Electric field measurement device
- Patent Title (中): 电场测量装置
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Application No.: US14406896Application Date: 2014-05-15
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Publication No.: US09568506B2Publication Date: 2017-02-14
- Inventor: Norihito Fujinoki
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2013-107715 20130522
- International Application: PCT/JP2014/002572 WO 20140515
- International Announcement: WO2014/188685 WO 20141127
- Main IPC: G01R15/24
- IPC: G01R15/24 ; H04B13/00 ; A61B5/00 ; A61B5/0476 ; G02F1/035 ; G01R29/08

Abstract:
The present application discloses electric field measurement device for measuring electric field of a target. Electric field measurement device includes optical waveguide which transmits transmission light, electrode portion, which gives optical characteristics of optical waveguide periodic variation, antenna for setting first state, in which electric field is coupled to optical waveguide, and second state, in which electric field is disconnected from optical waveguide, detector which detects light intensity of emission light emitted from optical waveguide, and applicator which applies voltage to electrode portion to give periodic variation. Applicator includes setting portion, which sets reference voltage in correspondence to light intensity under the second state, and output portion, which outputs voltage in correspondence to difference between reference voltage and induced voltage happening to electrode portion under first state.
Public/Granted literature
- US20150185256A1 ELECTRIC FIELD MEASUREMENT DEVICE Public/Granted day:2015-07-02
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