Invention Grant
- Patent Title: Self-diagnostic apparatus and method for electric device
- Patent Title (中): 电气设备自诊断装置及方法
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Application No.: US13734066Application Date: 2013-01-04
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Publication No.: US09568517B2Publication Date: 2017-02-14
- Inventor: Se Hoon Lim , Hee Jae Jo
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2012-0000844 20120104
- Main IPC: G01R21/00
- IPC: G01R21/00 ; G06F17/00 ; G01R31/00

Abstract:
A diagnostic method and apparatus for self-diagnosis a load side of an electric device to detect the occurrence of the abnormal electricity usage at the load using a simple apparatus based on a current sensor includes checking rated power consumption of a load, measuring power consumption of the load in operation, calculating a change in the power consumption by comparing the rated power consumption of the load with the power consumption of the load in operation, and determining that an abnormal power consumption occurs at the load when the change in the power consumption is outside a predetermined range.
Public/Granted literature
- US20130173186A1 SELF-DIAGNOSTIC APPARATUS AND METHOD FOR ELECTRIC DEVICE Public/Granted day:2013-07-04
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