Invention Grant
- Patent Title: Displacement measurements using simulated multi-wavelength light sources
- Patent Title (中): 使用模拟多波长光源进行位移测量
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Application No.: US14486018Application Date: 2014-09-15
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Publication No.: US09568640B2Publication Date: 2017-02-14
- Inventor: Sebastian Csutak , Carl M. Edwards
- Applicant: Sebastian Csutak , Carl M. Edwards
- Applicant Address: US TX Houston
- Assignee: BAKER HUGHES INCORPORATED
- Current Assignee: BAKER HUGHES INCORPORATED
- Current Assignee Address: US TX Houston
- Agency: Cantor Colburn LLP
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01L1/24 ; G01V7/00 ; G01V1/16 ; G01V8/12

Abstract:
An embodiment of an apparatus for estimating a parameter includes a multi-wavelength electromagnetic source configured to emit electromagnetic radiation beams having multiple wavelengths at a fixed angle relative to an interferometer, the multi-wavelength source having a stabilizer configured to lock each beam to one of a plurality of discrete wavelength ranges. The apparatus also includes the interferometer, which has a fixed reference reflector and a moveable reflecting assembly coupled to a moveable mass, the mass configured to move in response to the parameter. The apparatus further includes a detector configured to detect an interference pattern generated by the interferometer for each beam, and a processor configured to combine the interference patterns and estimate the parameter based on the combined interference pattern.
Public/Granted literature
- US20160077235A1 DISPLACEMENT MEASUREMENTS USING SIMULATED MULTI-WAVELENGTH LIGHT SOURCES Public/Granted day:2016-03-17
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