Invention Grant
- Patent Title: Self-measuring nonvolatile memory device systems and methods
- Patent Title (中): 自测量非易失性存储器件系统和方法
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Application No.: US14549418Application Date: 2014-11-20
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Publication No.: US09569622B2Publication Date: 2017-02-14
- Inventor: Lance Walker Dover
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F21/57 ; H04L9/32

Abstract:
One embodiment describes a computing system that includes a boot device. The boot device includes nonvolatile memory that stores startup routine instructions and a first pointer, in which the first pointer identifies a first one or more memory addresses in the nonvolatile memory where at least a portion of the startup routine instructions are stored, and a microcontroller that retrieves the startup routine instructions from the nonvolatile memory using the first pointer and determines whether the startup routine instructions are corrupted before executing any portion of the startup routine instructions. The computing system further includes a central processor communicatively coupled to the boot device, in which the central processor executes the startup routine instructions to initialize the computing system when the microcontroller determines that the startup routine instructions are not corrupted.
Public/Granted literature
- US20160147997A1 SELF-MEASURING NONVOLATILE MEMORY DEVICE SYSTEMS AND METHODS Public/Granted day:2016-05-26
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