Invention Grant
US09570282B2 Ionization within ion trap using photoionization and electron ionization
有权
使用光电离和电子电离离子阱内的离子化
- Patent Title: Ionization within ion trap using photoionization and electron ionization
- Patent Title (中): 使用光电离和电子电离离子阱内的离子化
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Application No.: US14205905Application Date: 2014-03-12
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Publication No.: US09570282B2Publication Date: 2017-02-14
- Inventor: Abrar Riaz , David Rafferty , James Wylde
- Applicant: 1ST DETECT CORPORATION
- Applicant Address: US TX Austin
- Assignee: 1ST DETECT CORPORATION
- Current Assignee: 1ST DETECT CORPORATION
- Current Assignee Address: US TX Austin
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/10 ; H01J49/42 ; H01J49/14 ; H01J49/16
Abstract:
A mass spectrometer is disclosed. The mass spectrometer may include an ion trap configured to trap and analyze an ionized sample. A first aperture may be provided having a first diameter, and a second aperture may be provided having a second diameter. The first aperture may be configured to receive electrons for the purpose of ionizing sample ions within the ion trap. The second aperture may be configured to receive photons for the purpose of ionizing sample ions within the ion trap.
Public/Granted literature
- US20140264010A1 IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZATION Public/Granted day:2014-09-18
Information query
