Invention Grant
- Patent Title: Optical field enhancement device, light measurement apparatus and method
- Patent Title (中): 光场增强装置，光测量装置及方法
-
Application No.: US14619347Application Date: 2015-02-11
-
Publication No.: US09575003B2Publication Date: 2017-02-21
- Inventor: Masayuki Naya , Shogo Yamazoe
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2012-180009 20120815; JP2013-033523 20130222
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/65 ; G01N21/01
Abstract:
An optical field enhancement device that generates an enhanced optical field on a surface of a metal film by an optical field enhancement effect of localized plasmon induced on the surface of the metal film by light projected onto a nanostructure on which the metal film is formed, the device including a transparent substrate having a transparent nanostructure on a surface, a metal film formed on a surface of the nanostructure, and a support member for supporting a subject at a position spaced apart from the surface of the metal film.
Public/Granted literature
- US20150153284A1 OPTICAL FIELD ENHANCEMENT DEVICE, LIGHT MEASUREMENT APPARATUS AND METHOD Public/Granted day:2015-06-04
Information query
