Invention Grant
- Patent Title: Vision inspection apparatus and method of compensating gamma defect and mura defect thereof
- Patent Title (中): 视力检查装置及补偿伽马缺陷及其缺陷的方法
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Application No.: US14681015Application Date: 2015-04-07
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Publication No.: US09576541B2Publication Date: 2017-02-21
- Inventor: Jae-Seob Chung , Hoi-Sik Moon , Kang-Hyun Kim , Jong-Hee Na , Woo-Jin Jung , Jung-Suk Han
- Applicant: SAMSUNG DISPLAY CO., LTD.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR10-2014-0163618 20141121
- Main IPC: H04N17/00
- IPC: H04N17/00 ; G09G3/36

Abstract:
A vision inspection apparatus includes a first luminance profile generator configured to generate a plurality of first luminance profiles corresponding to the plurality of reference grayscales, a gamma corrector configured to calculate a gamma correction value of the display apparatus using the plurality of first luminance profiles corresponding to the plurality of reference grayscales, and a second luminance profile generator configured to apply the gamma correction value to each of the plurality of first luminance profiles and to generate a plurality of second luminance profiles corresponding to the plurality of reference grayscales.
Public/Granted literature
- US20160148582A1 VISION INSPECTION APPARATUS AND METHOD OF COMPENSATING GAMMA DEFECT AND MURA DEFECT THEREOF Public/Granted day:2016-05-26
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