Invention Grant
- Patent Title: Method and apparatus for measuring channel quality indicator in wireless communication system
- Patent Title (中): 无线通信系统中信道质量指标的测量方法和装置
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Application No.: US14359054Application Date: 2012-11-23
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Publication No.: US09578532B2Publication Date: 2017-02-21
- Inventor: Jin Young Chun , Bin Chul Ihm , Ji Won Kang , Ki Tae Kim , Sung Ho Park , Su Nam Kim
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Lee Hong Degerman Kang Waimey
- International Application: PCT/KR2012/009967 WO 20121123
- International Announcement: WO2013/077661 WO 20130530
- Main IPC: H04L5/00
- IPC: H04L5/00 ; H04W24/10 ; H04B7/04 ; H04B7/06

Abstract:
Provided are a method and an apparatus for measuring channel quality indicator in a wireless communication system. User equipment receives, from a base station, at least one of a cell-specific reference signal (CRS) which is cell-specifically transmitted and a channel state information reference signal (CSI RS). The user equipment also receives, from the base station, a demodulation reference signal (DMRS) which is user equipment-specifically transmitted in an enhanced physical downlink control channel (e-PDCCH) region constituted in a physical downlink shared channel (PDSCH) region. The terminal measures the CQI based on either at least one of the CRS and the CSI RS or the DMRS.
Public/Granted literature
- US20140301238A1 METHOD AND APPARATUS FOR MEASURING CHANNEL QUALITY INDICATOR IN WIRELESS COMMUNICATION SYSTEM Public/Granted day:2014-10-09
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