发明授权
US09583161B1 Repair circuit, memory apparatus using the same and operating method thereof
有权
修理电路,使用其的存储装置及其操作方法
- 专利标题: Repair circuit, memory apparatus using the same and operating method thereof
- 专利标题(中): 修理电路,使用其的存储装置及其操作方法
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申请号: US15246614申请日: 2016-08-25
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公开(公告)号: US09583161B1公开(公告)日: 2017-02-28
- 发明人: Yong Seop Kim , Ji Hyae Bae , Min Chul Shin , Jun Gi Choi
- 申请人: SK hynix Inc.
- 申请人地址: KR Icheon-si
- 专利权人: SK hynix Inc.
- 当前专利权人: SK hynix Inc.
- 当前专利权人地址: KR Icheon-si
- 代理机构: William Parker & Associates Ltd.
- 优先权: KR10-2016-0018511 20160217
- 主分类号: G11C17/18
- IPC分类号: G11C17/18 ; G11C7/22 ; G11C8/08 ; G11C8/10 ; G11C29/00 ; G11C17/16
摘要:
A memory apparatus includes a first memory bank, a second memory bank, a row decoder and repair circuit, and an input/output driver controller. The row decoder and repair circuit is coupled to the first and second memory banks in common. The row decoder and repair circuit generates a shared repair signal according to whether a word line disposed in a first memory bank is replaced with a word line disposed in a second memory bank. The input/output driver controller allows read or write operations for one of the first and second memory banks to be performed based on the shared repair signal and an operation signal.
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