Invention Grant
- Patent Title: Film formation device, substrate processing device, and film formation method
- Patent Title (中): 成膜装置,基板处理装置和成膜方法
-
Application No.: US14100224Application Date: 2013-12-09
-
Publication No.: US09583312B2Publication Date: 2017-02-28
- Inventor: Jun Yamawaku , Chishio Koshimizu , Yohei Yamazawa , Mitsuhiro Tachibana , Hitoshi Kato , Takeshi Kobayashi , Shigehiro Miura , Takafumi Kimura
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2012-273581 20121214
- Main IPC: H01L21/306
- IPC: H01L21/306 ; C23C16/00 ; H01J37/32 ; H01L21/02 ; H01L21/687 ; C23C16/455 ; C23C16/458

Abstract:
A film formation device to conduct a film formation process for a substrate includes a rotating table, a film formation area configured to include a process gas supply part, a plasma processing part, a lower bias electrode provided at a lower side of a position of a height of the substrate on the rotating table, an upper bias electrode arranged at the same position of the height or an upper side of a position of the height, a high-frequency power source part connected to at least one of the lower bias electrode and the upper bias electrode and configured to form a bias electric potential on the substrate in such a manner that the lower bias electrode and the upper bias electrode are capacitively coupled, and an exhaust mechanism.
Public/Granted literature
- US20140170859A1 FILM FORMATION DEVICE, SUBSTRATE PROCESSING DEVICE, AND FILM FORMATION METHOD Public/Granted day:2014-06-19
Information query
IPC分类: