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US09583536B2 Memory device and method for manufacturing the same 有权
存储器件及其制造方法

Memory device and method for manufacturing the same
Abstract:
A memory device having an array area and a periphery area is provided. The memory device includes a substrate, an isolation layer formed in the substrate, a first doped region formed on the isolation layer in the array area, a second doped region formed on the first doped region, a metal silicide layer formed on the second doped region, and a metal silicide oxide layer formed on the metal silicide layer.
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