Invention Grant
- Patent Title: Semiconductor device and method of forming the same
- Patent Title (中): 半导体器件及其形成方法
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Application No.: US14737186Application Date: 2015-06-11
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Publication No.: US09583617B2Publication Date: 2017-02-28
- Inventor: Shih-Yin Hsiao , Ching-Chung Yang
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Priority: CN201510251397 20150518
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L29/66 ; H01L21/70 ; H01L29/78

Abstract:
Provided is a semiconductor device including a substrate, an insulating layer, a conductive layer and at least one spacer. The substrate has at least two shallow trenches therein. The conductive layer is disposed on the substrate between the shallow trenches. The insulating layer is disposed between the substrate and the conductive layer. The at least one spacer is disposed on one sidewall of the conductive layer and fills up each shallow trench. A method of forming a semiconductor device is further provided.
Public/Granted literature
- US20160343855A1 SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME Public/Granted day:2016-11-24
Information query
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