发明授权
US09584134B2 Correcting temperature based oscillation frequency errors in semiconductor device
有权
在半导体器件中校正基于温度的振荡频率误差
- 专利标题: Correcting temperature based oscillation frequency errors in semiconductor device
- 专利标题(中): 在半导体器件中校正基于温度的振荡频率误差
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申请号: US14926534申请日: 2015-10-29
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公开(公告)号: US09584134B2公开(公告)日: 2017-02-28
- 发明人: Kazuya Yamada , Toshihisa Sone , Akihiro Takei , Yuichi Yoshida , Kengo Takemasa
- 申请人: LAPIS Semiconductor Co., Ltd.
- 申请人地址: JP Yokohama
- 专利权人: LAPIS SEMICONDUCTOR CO., LTD.
- 当前专利权人: LAPIS SEMICONDUCTOR CO., LTD.
- 当前专利权人地址: JP Yokohama
- 代理机构: Rabin & Berdo, P.C.
- 优先权: JP2012-104075 20120427
- 主分类号: G01R31/3187
- IPC分类号: G01R31/3187 ; H03L1/02 ; G01R21/00 ; H03L1/04 ; G01R35/04 ; G01R22/10 ; H03K3/011 ; G01R22/06 ; G01R1/44
摘要:
A semiconductor device includes an oscillator that oscillates at a specific frequency, a semiconductor integrated circuit that integrates a temperature sensor that detects a peripheral temperature, and a controller that is electrically connected to the oscillator and that corrects temperature dependent error in the oscillation frequency of the oscillator based on the temperature detected by the temperature sensor and a sealing member that integrally seals the oscillator and the semiconductor integrated circuit.
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