Invention Grant
- Patent Title: Sample holder
- Patent Title (中): 样品架
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Application No.: US14770045Application Date: 2014-02-24
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Publication No.: US09589826B2Publication Date: 2017-03-07
- Inventor: Hiroshi Ono
- Applicant: KYOCERA Corporation
- Applicant Address: JP Kyoto
- Assignee: Kyocera Corporation
- Current Assignee: Kyocera Corporation
- Current Assignee Address: JP Kyoto
- Agency: Volpe and Koenig, P.C.
- Priority: JP2013-034780 20130225
- International Application: PCT/JP2014/054335 WO 20140224
- International Announcement: WO2014/129625 WO 20140828
- Main IPC: H01L21/687
- IPC: H01L21/687 ; H01L21/683 ; C04B37/02 ; H01L21/67

Abstract:
A sample holder includes a substrate composed of ceramics, having a sample holding surface provided in an upper face thereof; a supporting member composed of metal, an upper face of the supporting member covering a lower face of the substrate; and a joining layer composed of indium or an indium alloy, the substrate and the supporting member being joined to each other via the joining layer. The joining layer has a layer region in at least one of a joining surface to the substrate and a joining surface to the supporting member, a content percentage of indium oxides of the layer region being higher than that of an intermediate region in a thickness direction of the joining layer.
Public/Granted literature
- US20160005639A1 SAMPLE HOLDER Public/Granted day:2016-01-07
Information query
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