发明授权
- 专利标题: Method for detecting alignment film and device for the same
- 专利标题(中): 检测取向膜的方法及其装置
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申请号: US14132634申请日: 2013-12-18
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公开(公告)号: US09595093B2公开(公告)日: 2017-03-14
- 发明人: Haiyun Lin , Qinghui Zhao , Chengtan Zhao
- 申请人: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 申请人地址: CN Beijing
- 专利权人: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人: BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 当前专利权人地址: CN Beijing
- 代理机构: Ladas & Parry LLP
- 优先权: CN201310036694 20130130
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T7/00
摘要:
A method for detecting an alignment film coated on a substrate of a liquid crystal panel comprises: obtaining an image of an alignment film test region of a substrate; and analyzing continuity of the alignment film along an internal boundary of the alignment film test region in the image obtained. since the alignment film test region is located outside an active display area of the substrate, when the alignment film along the internal boundary of the alignment film test region is determined as continuous, it can be determined that all the edges of the alignment film are outside the active display area, then a Haro region which might appear on the edge of the alignment film may also be located outside the active display area, so as to ensure uniform thickness of the alignment film in the active display area of the substrate.