Invention Grant
- Patent Title: Manufacturer self-test for solid-state drives
- Patent Title (中): 制造商对固态硬盘的自检
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Application No.: US14223407Application Date: 2014-03-24
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Publication No.: US09595352B2Publication Date: 2017-03-14
- Inventor: Zhengang Chen , David Patmore , Yingji Ju , Erich F. Haratsch
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Christopher P. Maiorana, PC
- Main IPC: G11C29/44
- IPC: G11C29/44 ; G11C29/42 ; H04L1/00 ; G06F11/00 ; G11C7/10 ; G11C16/00

Abstract:
An apparatus comprising a memory and a controller. The memory is configured to process a plurality of read/write operations. The memory comprises a plurality of memory modules each having a size less than a total size of the memory. The controller is configured to process a plurality of I/O requests to blocks of the memory that are not marked as bad on a block list. The controller is configured to track a plurality of bad blocks of the memory. The controller is configured to perform a plurality of scans on the memory. The scans are configured to (a) identify the bad blocks, and (b) mark the bad blocks as bad on the block list.
Public/Granted literature
- US20150262712A1 MANUFACTURER SELF-TEST FOR SOLID-STATE DRIVES Public/Granted day:2015-09-17
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