Invention Grant
US09595352B2 Manufacturer self-test for solid-state drives 有权
制造商对固态硬盘的自检

Manufacturer self-test for solid-state drives
Abstract:
An apparatus comprising a memory and a controller. The memory is configured to process a plurality of read/write operations. The memory comprises a plurality of memory modules each having a size less than a total size of the memory. The controller is configured to process a plurality of I/O requests to blocks of the memory that are not marked as bad on a block list. The controller is configured to track a plurality of bad blocks of the memory. The controller is configured to perform a plurality of scans on the memory. The scans are configured to (a) identify the bad blocks, and (b) mark the bad blocks as bad on the block list.
Public/Granted literature
Information query
Patent Agency Ranking
0/0