Invention Grant
- Patent Title: Scanning laser planarity detection
- Patent Title (中): 扫描激光平面度检测
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Application No.: US14483468Application Date: 2014-09-11
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Publication No.: US09596440B2Publication Date: 2017-03-14
- Inventor: P. Selvan Viswanathan , Robert James Jackson
- Applicant: Microvision, Inc.
- Applicant Address: US WA Redmond
- Assignee: Microvision, Inc.
- Current Assignee: Microvision, Inc.
- Current Assignee Address: US WA Redmond
- Agent Kevin D. Wills
- Main IPC: G03B21/20
- IPC: G03B21/20 ; H04N9/31 ; G02B26/10 ; G02B27/10
Abstract:
A scanning laser projector includes a proximity sensor and a planarity detector. When the proximity sensor detects an object closer than a proximity threshold, laser power is turned down. The scanning laser projector can measure distance at a plurality of projection points in the projector's field of view. If the projection points lie substantially in a plane, laser power may be turned back up.
Public/Granted literature
- US20160080709A1 Scanning Laser Planarity Detection Public/Granted day:2016-03-17
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