- 专利标题: Nanowire fabrication method and structure thereof
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申请号: US14504488申请日: 2014-10-02
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公开(公告)号: US09601571B2公开(公告)日: 2017-03-21
- 发明人: Martin Christopher Holland , Georgios Vellianitis , Matthias Passlack
- 申请人: Taiwan Semiconductor Manufacturing Company Limited
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company Limited
- 当前专利权人: Taiwan Semiconductor Manufacturing Company Limited
- 当前专利权人地址: TW Hsinchu
- 代理机构: Jones Day
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L29/20 ; H01L21/02
摘要:
A method of providing an out-of-plane semiconductor structure and a structure fabricated thereby is disclosed. The method comprises acts of: providing a substrate defining a major surface; providing a template layer having a predetermined template thickness on the major surface of the substrate; forming a recess in the template layer having a recess pattern and a recess depth smaller than the template thickness; and epitaxially growing a semiconductor structure from the recess. A planar shape of the recess pattern formed in the template layer substantially dictates an extending direction of the semiconductor structure.
公开/授权文献
- US20160099312A1 NANOWIRE FABRICATION METHOD AND STRUCTURE THEREOF 公开/授权日:2016-04-07
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