Invention Grant
- Patent Title: X-ray imaging apparatus and control method thereof
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Application No.: US14303905Application Date: 2014-06-13
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Publication No.: US09603577B2Publication Date: 2017-03-28
- Inventor: Hyun Hwa Oh , Dong Goo Kang , Sung Hoon Kang , Young Hun Sung
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0068034 20130613
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/06

Abstract:
An X-ray imaging apparatus and control method for the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes an X-ray source to generate X-ray beams, and to irradiate the X-ray beams onto an object; a first X-ray detector configured to detect X-ray beams transmitted through the object and generate a first phase contrast signal; an X-ray obtainer including an X-ray collimator and a second X-ray detector, wherein the X-ray collimator is spaced apart from the object by a predetermined distance, and configured to focus the X-ray beams transmitted through the object, and wherein the second X-ray detector is configured to detect the focused X-ray beams and generate a second phase contrast signal based on the detected X-ray beams; and an image processor configured to create a phase contrast image and an absorption image of the object.
Public/Granted literature
- US20140369472A1 X-RAY IMAGING APPARATUS AND CONTROL METHOD THEREOF Public/Granted day:2014-12-18
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