Invention Grant
- Patent Title: Providing autonomous self-testing of a processor
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Application No.: US14737768Application Date: 2015-06-12
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Publication No.: US09612930B2Publication Date: 2017-04-04
- Inventor: Vedvyas Shanbhogue , Eric Rasmussen , Deep K. Buch , Gordon McFadden , Kameswar Subramaniam , Amy L. Santoni , Willard M. Wiseman , Bret L. Toll
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/263 ; G06F11/22 ; G06F11/14

Abstract:
In an embodiment, a processor includes at least one core, a power management unit having a first test register including a first field to store a test patch identifier associated with a test patch and a second field to store a test mode indicator to request a core functionality test, and a microcode storage to store microcode to be executed by the at least one core. Responsive to the test patch identifier, the microcode may access a firmware interface table and obtain the test patch from a non-volatile storage according to an address obtained from the firmware interface table. Other embodiments are described and claimed.
Public/Granted literature
- US20160364308A1 PROVIDING AUTONOMOUS SELF-TESTING OF A PROCESSOR Public/Granted day:2016-12-15
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