Invention Grant
- Patent Title: Automated analyzer
-
Application No.: US14413578Application Date: 2013-07-08
-
Publication No.: US09618526B2Publication Date: 2017-04-11
- Inventor: Yoshiaki Saito , Yoichi Aruga , Toshihide Orihashi
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-164300 20120725
- International Application: PCT/JP2013/068582 WO 20130708
- International Announcement: WO2014/017275 WO 20140130
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N1/38

Abstract:
An automated analyzer that can effectively reduce contamination of a diluted low-concentration specimen resulting from a high-concentration specimen not being diluted. The automated analyzer includes a specimen nozzle that performs both the function of pipetting a specimen from a specimen container accommodating the specimen and the function of pipetting a specimen diluted by the analyzer, and means for washing the specimen nozzle with a predetermined detergent. When a pipetting process of a high-concentration specimen not being diluted and a pipetting process of a low-concentration specimen diluted by the analyzer are consecutively performed for the same specimen by the specimen nozzle, between the pipetting process of a high-concentration specimen and the pipetting process of a low-concentration specimen, the analyzer performs a washing processing in which the specimen nozzle is washed with the predetermined detergent.
Public/Granted literature
- US20150153370A1 AUTOMATED ANALYZER Public/Granted day:2015-06-04
Information query