Invention Grant
- Patent Title: Apparatus for and method of channel quality prediction through computation of multi-layer channel quality metric
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Application No.: US15040437Application Date: 2016-02-10
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Publication No.: US09628154B2Publication Date: 2017-04-18
- Inventor: Dongwoon Bai , Jungwon Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: The Farrell Law Firm, P.C.
- Main IPC: H04L1/02
- IPC: H04L1/02 ; H04B7/0413 ; H04B17/309 ; H04L1/20

Abstract:
An apparatus and method for a transceiver are provided. The apparatus for the transceiver includes a multiple input multiple output (MIMO) antenna; a transceiver connected to the MIMO antenna; and a processor configured to measure channel gain Hk, based on the received signal, where k is a sample index from 1 to K, Hk is an m×n matrix of complex channel gain known to the transceiver, measure noise variance σ2 of a channel, calculate a per-sample channel quality metric q(Hk, σ2) using at least one bound of mutual information; reduce a dimension of a channel quality metric vector (q(H1, σ2), . . . , q(HK, σ2)) by applying a dimension reduction function g(.); and estimate a block error rate (BLER) as a function of a dimension reduced channel quality metric g(q(H1, σ2), . . . , q(HK, σ2)).
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