Invention Grant
- Patent Title: Optical measurement method and measurement system for determining 3D coordinates on a measurement object surface
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Application No.: US14004880Application Date: 2012-05-16
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Publication No.: US09628779B2Publication Date: 2017-04-18
- Inventor: Knut Siercks
- Applicant: Knut Siercks
- Applicant Address: CH Heerbrugg
- Assignee: HEXAGON TECHNOLOGY CENTER GMBH
- Current Assignee: HEXAGON TECHNOLOGY CENTER GMBH
- Current Assignee Address: CH Heerbrugg
- Agency: Maschoff Brennan
- Priority: EP11166780 20110519
- International Application: PCT/EP2012/059120 WO 20120516
- International Announcement: WO2012/156448 WO 20121122
- Main IPC: G06T7/521
- IPC: G06T7/521 ; H04N13/02 ; G01B11/25

Abstract:
An optical measurement method for determining 3D coordinates of a plurality of measurement points on a measurement object surface. The measurement object surface is illuminated with a pattern sequence of different patterns by a projector, an image sequence of the measurement object surface illuminated with the pattern sequence is recorded with a camera system, and the 3D coordinates of the measurement points are determined by evaluating the image sequence, in particular wherein a succession of brightness values for identical measurement points on the measurement object surface is ascertained in respective images of the recorded image sequence. Translational and/or rotational accelerations of the projector, of the camera system and/or of the measurement object are measured here and, in dependence on the measured accelerations, the illumination of the measurement object surface and/or the recording of the image sequence is/are reactively adapted, in particular temporally substantially directly and live during the measurement process.
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