Invention Grant
- Patent Title: Attenuated total reflection spectroscopic analysis apparatus having device for measuring specimen contact area and method of operating the same
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Application No.: US14809433Application Date: 2015-07-27
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Publication No.: US09636054B2Publication Date: 2017-05-02
- Inventor: Sangyun Park , Sangkyu Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2015-0006978 20150114
- Main IPC: G01N21/55
- IPC: G01N21/55 ; A61B5/1455 ; G01N21/552 ; A61B5/00

Abstract:
An attenuated total reflection (ATR) spectroscopic analysis apparatus includes an ATR prism including: an upper surface that contacts a specimen, a lower surface facing the upper surface, a first surface that is slanted and connected to the upper surface and the lower surface, and a second surface that is slanted and connected to the upper surface and the lower surface and facing the first surface; a light source configured to emit a light towards the first surface of the ATR prism; a light receiver that is provided to face the lower surface of the ATR prism and configured to receive the light that is diffusely reflected and output from the lower surface and output an electrical signal based on the received light; and a computation processor configured to calculate a contact area of the specimen with the upper surface of the ATR prism in response to the electrical signal.
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