- 专利标题: Measuring apparatus, measuring system, and measuring method
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申请号: US14293039申请日: 2014-06-02
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公开(公告)号: US09638575B2公开(公告)日: 2017-05-02
- 发明人: Yuji Yamanaka , Go Maruyama , Kensuke Masuda , Sho Nagai
- 申请人: Yuji Yamanaka , Go Maruyama , Kensuke Masuda , Sho Nagai
- 申请人地址: JP Tokyo
- 专利权人: Ricoh Company, Ltd.
- 当前专利权人: Ricoh Company, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2013-128523 20130619; JP2013-256076 20131211; JP2014-078733 20140407
- 主分类号: G01J3/02
- IPC分类号: G01J3/02 ; G01J3/51 ; G01J3/46 ; G01J3/52
摘要:
A measuring apparatus and a measuring method are provided. The measuring apparatus includes an optical system to condense light, a light receiving device to receive light condensed by the optical system at a plurality of light receiving positions and convert the light into an electric signal, a plurality of optical band-pass filters arranged near a lens stop of the optical system, each of the optical band-pass filters having a different spectral transmittance, a lens array arranged between the optical system and the light receiving device, the lens array having a plurality of lenses each of which is arranged substantially in parallel with a two-dimensional surface of the light receiving device, and a correction unit to correct the electric signal for each one of the plurality of light receiving positions of the light receiving device. The measuring method is performed by the measuring apparatus.
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