Invention Grant
- Patent Title: Resistive memory device and operating method
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Application No.: US14619992Application Date: 2015-02-11
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Publication No.: US09646687B2Publication Date: 2017-05-09
- Inventor: Hyo-Jin Kwon , Yeong-Taek Lee , Dae-Seok Byeon , Yong-Kyu Lee , Hyun-Kook Park
- Applicant: Hyo-Jin Kwon , Yeong-Taek Lee , Dae-Seok Byeon , Yong-Kyu Lee , Hyun-Kook Park
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0072973 20140616
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G11C13/00 ; G11C29/52

Abstract:
Provided are a resistive memory device and an operating method for the resistive memory device. The operating method includes detecting a write cycle, determining whether or not to perform a recovery operation by comparing the detected write cycle with a first reference value, and upon determining to perform the recovery operation, performing the recovery operation on target memory cells of the memory cell array.
Public/Granted literature
- US20150363257A1 RESISTIVE MEMORY DEVICE AND OPERATING METHOD Public/Granted day:2015-12-17
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